Crystal Buffer / Divider Board
Thousands Sold!
The TestNet Crystal Buffer / Divider Board is used for
dealing with the measurement of crystal oscillators
and other components that share the same nodes.
In addition, it can be used to test individual oscillators
or clock generators on your product. The buffer/divider
board also helps stabilize digital testing in general and FLASH memory programming
in particular. The signal wire attenuation effects and crosstalk are reduced by
mounting this small board in the fixture, as close as possible to the DUT.
Now, high frequency crystals on printed circuit boards can be reliably measured thus
verifying their presence and functionality. The production process no longer has to
rely on visual inspection to detect missing or wrong crystals or poor solder
connections. In high volume production testing applications, the new board can help
detect heat and moisture related process problems as indicated by failed crystal
measurement.
Another application where the benefits of the new product are significant is during
value added FLASH memory programming at In-circuit test. Integrating the
buffer/divider board into the fixture and test program when testing the
microprocessor crystal allows the crystal to free run, by disconnecting the fixture
wires and therefore their attenuation effect on the circuit. Although the micro-
processor is disabled during FLASH programming, loading on its crystal nodes can
cause the microprocessor to enter a CMOS latch up state thus producing intermittent
FLASH programming results. The TestNet Crystal Buffer / Divider Board prevents this
effect from occurring and allows for reliable FLASH programming.
Crystal/Oscillator/Generator testing, FLASH memory programming, and digital
testing while holding the microprocessor in reset, all become more reliable when
incorporating this board into the ATE test fixture and as part of the test program.
The board helps ATE engineers provide more complete and stable test programs
in less time. The net effect is significant cost savings due to shortened test
development time, improved process test coverage, and then improved yield at
functional test.
The board mounts inside the test fixtures for ATE systems from suppliers including
Teradyne, Agilent, GenRad, and others.
The list price of the Crystal Buffer / Divider Board price is under $250, and less in
quantities.
Thousands Sold!
The TestNet Crystal Buffer / Divider Board is used for
dealing with the measurement of crystal oscillators
and other components that share the same nodes.
In addition, it can be used to test individual oscillators
or clock generators on your product. The buffer/divider
board also helps stabilize digital testing in general and FLASH memory programming
in particular. The signal wire attenuation effects and crosstalk are reduced by
mounting this small board in the fixture, as close as possible to the DUT.
Now, high frequency crystals on printed circuit boards can be reliably measured thus
verifying their presence and functionality. The production process no longer has to
rely on visual inspection to detect missing or wrong crystals or poor solder
connections. In high volume production testing applications, the new board can help
detect heat and moisture related process problems as indicated by failed crystal
measurement.
Another application where the benefits of the new product are significant is during
value added FLASH memory programming at In-circuit test. Integrating the
buffer/divider board into the fixture and test program when testing the
microprocessor crystal allows the crystal to free run, by disconnecting the fixture
wires and therefore their attenuation effect on the circuit. Although the micro-
processor is disabled during FLASH programming, loading on its crystal nodes can
cause the microprocessor to enter a CMOS latch up state thus producing intermittent
FLASH programming results. The TestNet Crystal Buffer / Divider Board prevents this
effect from occurring and allows for reliable FLASH programming.
Crystal/Oscillator/Generator testing, FLASH memory programming, and digital
testing while holding the microprocessor in reset, all become more reliable when
incorporating this board into the ATE test fixture and as part of the test program.
The board helps ATE engineers provide more complete and stable test programs
in less time. The net effect is significant cost savings due to shortened test
development time, improved process test coverage, and then improved yield at
functional test.
The board mounts inside the test fixtures for ATE systems from suppliers including
Teradyne, Agilent, GenRad, and others.
The list price of the Crystal Buffer / Divider Board price is under $250, and less in
quantities.
| 1300 Chase Street Algonquin, IL 60102-9667 847-458-9791 t e a m @ t e s t n e t i n c . n e t |
TestNet
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| Hundreds Designed and Sold Made in the U.S.A. |
| Thousands Sold Add this small board to an ATE System fixture and program and measure resonant crystal and electronic oscillator frequencies to 100MHz during In-Circuit Test (ICT). |
| Teradyne Support Network Member Since 1995 |
| Hundreds Sold System fixture and program and measure up to eight electronic oscillator frequencies to 100MHz during In-Circuit Test (ICT). |
| While you are here, don't forget to check out the newest fixturing method for a great ROI, our New Modular Test Fixture: (Click here to learn more) |